Commit message (Expand) | Author | Age | Files | Lines | |
---|---|---|---|---|---|
* | dm: i2c: Add tests for I2C | Simon Glass | 2014-12-11 | 1 | -0/+17 |
* | dm: sf: Add tests for SPI flash | Simon Glass | 2014-10-22 | 1 | -1/+16 |
* | dm: Provide a function to scan child FDT nodes | Simon Glass | 2014-07-23 | 1 | -1/+15 |
* | dm: Introduce device sequence numbering | Simon Glass | 2014-07-23 | 1 | -1/+10 |
* | dm: Allow drivers to be marked 'before relocation' | Simon Glass | 2014-07-23 | 1 | -0/+10 |
* | dm: Use an explicit expect value in core tests | Simon Glass | 2014-07-23 | 1 | -1/+4 |
* | dm: Add basic tests | Simon Glass | 2014-03-04 | 1 | -0/+59 |