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| author | Joe Hershberger <joe.hershberger@ni.com> | 2015-05-20 14:27:27 -0500 |
|---|---|---|
| committer | Tom Rini <trini@konsulko.com> | 2015-05-21 09:16:16 -0400 |
| commit | e721b882e9daf3ad3599eef5a9ccf3847b694228 (patch) | |
| tree | d92fadcb65548e6ed19c60d4dfa27ecc80c3778c /test/dm/i2c.c | |
| parent | 6e0d26c0502e4d697cb235069aef188f8f1407d3 (diff) | |
| download | talos-obmc-uboot-e721b882e9daf3ad3599eef5a9ccf3847b694228.tar.gz talos-obmc-uboot-e721b882e9daf3ad3599eef5a9ccf3847b694228.zip | |
test: Generalize the unit test framework
Separate the ability to define tests and assert status of test functions
from the dm tests so they can be used more consistently throughout all
tests.
Signed-off-by: Joe Hershberger <joe.hershberger@ni.com>
Reviewed-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'test/dm/i2c.c')
| -rw-r--r-- | test/dm/i2c.c | 20 |
1 files changed, 10 insertions, 10 deletions
diff --git a/test/dm/i2c.c b/test/dm/i2c.c index c5939a165e..23d612eb81 100644 --- a/test/dm/i2c.c +++ b/test/dm/i2c.c @@ -10,19 +10,19 @@ #include <dm.h> #include <fdtdec.h> #include <i2c.h> +#include <asm/state.h> +#include <asm/test.h> #include <dm/device-internal.h> #include <dm/test.h> #include <dm/uclass-internal.h> -#include <dm/ut.h> #include <dm/util.h> -#include <asm/state.h> -#include <asm/test.h> +#include <test/ut.h> static const int busnum; static const int chip = 0x2c; /* Test that we can find buses and chips */ -static int dm_test_i2c_find(struct dm_test_state *dms) +static int dm_test_i2c_find(struct unit_test_state *uts) { struct udevice *bus, *dev; const int no_chip = 0x10; @@ -43,7 +43,7 @@ static int dm_test_i2c_find(struct dm_test_state *dms) } DM_TEST(dm_test_i2c_find, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); -static int dm_test_i2c_read_write(struct dm_test_state *dms) +static int dm_test_i2c_read_write(struct unit_test_state *uts) { struct udevice *bus, *dev; uint8_t buf[5]; @@ -60,7 +60,7 @@ static int dm_test_i2c_read_write(struct dm_test_state *dms) } DM_TEST(dm_test_i2c_read_write, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); -static int dm_test_i2c_speed(struct dm_test_state *dms) +static int dm_test_i2c_speed(struct unit_test_state *uts) { struct udevice *bus, *dev; uint8_t buf[5]; @@ -82,7 +82,7 @@ static int dm_test_i2c_speed(struct dm_test_state *dms) } DM_TEST(dm_test_i2c_speed, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); -static int dm_test_i2c_offset_len(struct dm_test_state *dms) +static int dm_test_i2c_offset_len(struct unit_test_state *uts) { struct udevice *bus, *dev; uint8_t buf[5]; @@ -99,7 +99,7 @@ static int dm_test_i2c_offset_len(struct dm_test_state *dms) } DM_TEST(dm_test_i2c_offset_len, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); -static int dm_test_i2c_probe_empty(struct dm_test_state *dms) +static int dm_test_i2c_probe_empty(struct unit_test_state *uts) { struct udevice *bus, *dev; @@ -114,7 +114,7 @@ static int dm_test_i2c_probe_empty(struct dm_test_state *dms) } DM_TEST(dm_test_i2c_probe_empty, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); -static int dm_test_i2c_bytewise(struct dm_test_state *dms) +static int dm_test_i2c_bytewise(struct unit_test_state *uts) { struct udevice *bus, *dev; struct udevice *eeprom; @@ -169,7 +169,7 @@ static int dm_test_i2c_bytewise(struct dm_test_state *dms) } DM_TEST(dm_test_i2c_bytewise, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); -static int dm_test_i2c_offset(struct dm_test_state *dms) +static int dm_test_i2c_offset(struct unit_test_state *uts) { struct udevice *eeprom; struct udevice *dev; |
