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authorMasahiro Yamada <yamada.m@jp.panasonic.com>2014-12-26 22:20:57 +0900
committerScott Wood <scottwood@freescale.com>2015-01-09 12:19:02 -0600
commitbf80ee6e1d73be046a7c5454c7e7493e7a6ea5e0 (patch)
treee7e5a6d530c6f625c7f69bbeb519c6d5d4020845 /board/gdsys/405ex
parent756963d7da746abd6448cb1d7be0c70b1c80ca35 (diff)
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mtd: nand: Mark the BBT as scanned prior to calling scan_bbt again
Commit 35c204d8a9d0 (nand: reinstate lazy bad block scanning) broke NAND_BBT_USE_FLASH feature. Its git-log claimed that it reinstated the change as by commit fb49454b1b6c ("nand: reinstate lazy bad block scanning"), but it moved "chip->options |= NAND_BBT_SCANNED" below "chip->scan_bbt(mtd);". It causes recursion if scan_bbt does not find a flash based BBT and tries to write one, and the attempt to erase the BBT area causes a bad block check. Reinstate commit ff49ea8977b5 (NAND: Mark the BBT as scanned prior to calling scan_bbt.). Signed-off-by: Masahiro Yamada <yamada.m@jp.panasonic.com> Cc: Rostislav Lisovy <lisovy@merica.cz> Cc: Heiko Schocher <hs@denx.de> Cc: Scott Wood <scottwood@freescale.com>
Diffstat (limited to 'board/gdsys/405ex')
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