Fix I2C/EEPROM tests to work when there are no I2C Targets

Change-Id: I22112ca863b19759eec9080742148bd71751b144
RTC: 39190
Reviewed-on: http://gfw160.austin.ibm.com:8080/gerrit/793
Tested-by: Jenkins Server
Reviewed-by: A. Patrick Williams III <iawillia@us.ibm.com>

2 files changed, 54 insertions, 0 deletions

diff --git a/src/usr/i2c/test/eepromddtest.H b/src/usr/i2c/test/eepromddtest.H
index 1be82c462..d71cdc88a 100755
--- a/src/usr/i2c/test/eepromddtest.H
+++ b/src/usr/i2c/test/eepromddtest.H
@@ -38,6 +38,7 @@
 #include <targeting/predicates/predicatectm.H>
 #include <targeting/predicates/predicatepostfixexpr.H>
 #include <targeting/util.H>
+#include "i2ctest.H"
 
 extern trace_desc_t* g_trac_eeprom;
 
@@ -134,6 +135,12 @@ class EEPROMTest: public CxxTest::TestSuite
 
                 for( uint32_t j = 0; j < fullList.size(); j++ )
                 {
+                    // Skip this target if EEPROM isn't available.
+                    if( !isI2CAvailable( fullList[j] ) )
+                    {
+                        continue;
+                    }
+
                     for( uint32_t i = 0; i < NUM_CMDS; i++ )
                     {
                         uint64_t data;
@@ -210,6 +217,12 @@ class EEPROMTest: public CxxTest::TestSuite
                 tS.masterProcChipTargetHandle( testTarget );
                 assert(testTarget != NULL);
 
+                // Skip this target if EEPROM isn't available.
+                if( !isI2CAvailable( testTarget ) )
+                {
+                    continue;
+                }
+
                 num_ops++;
                 err = deviceOp( DeviceFW::LAST_OP_TYPE,
                                 testTarget,
@@ -256,6 +269,12 @@ class EEPROMTest: public CxxTest::TestSuite
                 tS.masterProcChipTargetHandle( testTarget );
                 assert(testTarget != NULL);
 
+                // Skip this target if EEPROM isn't available.
+                if( !isI2CAvailable( testTarget ) )
+                {
+                    continue;
+                }
+
                 num_ops++;
                 err = deviceOp( DeviceFW::WRITE,
                                 testTarget,
diff --git a/src/usr/i2c/test/i2ctest.H b/src/usr/i2c/test/i2ctest.H
index f2ff71f5d..e9ab1212a 100755
--- a/src/usr/i2c/test/i2ctest.H
+++ b/src/usr/i2c/test/i2ctest.H
@@ -42,6 +42,29 @@ extern trace_desc_t* g_trac_i2c;
 
 using namespace TARGETING;
 
+bool isI2CAvailable( TARGETING::Target * i_target )
+{
+    bool avail = true;
+    EepromAddrInfo0 eepromData;
+    if( i_target->tryGetAttr<ATTR_EEPROM_ADDR_INFO0>( eepromData ) )
+    {
+        if( ( 0x80 == eepromData.port ) &&
+            ( 0x80 == eepromData.devAddr ) &&
+            ( 0x80 == eepromData.engine ) )
+        {
+            // Default values, thus, not present
+            avail = false;
+        }
+    }
+    else
+    {
+        // Didn't find attribute, thus, not present
+        avail = false;
+    }
+
+    return avail;
+}
+
 class I2CTest: public CxxTest::TestSuite
 {
     public:
@@ -193,6 +216,12 @@ class I2CTest: public CxxTest::TestSuite
                             break;
                     };
 
+                    // Check to see if I2C function is there
+                    if( !isI2CAvailable( theTarget ) )
+                    {
+                        continue;
+                    }
+
                     // do the operation
                     cmds++;
                     err = deviceOp( (testData[i].rnw ? DeviceFW::READ : DeviceFW::WRITE),
@@ -300,6 +329,12 @@ class I2CTest: public CxxTest::TestSuite
                 tS.masterProcChipTargetHandle( testTarget );
                 assert(testTarget != NULL);
 
+                // Check to see if I2C function is there
+                if( !isI2CAvailable( testTarget ) )
+                {
+                    continue;
+                }
+
                 num_ops++;
                 err = deviceOp( DeviceFW::LAST_OP_TYPE,
                                 testTarget,