Coalesce ERRL user detail data error log sections

Add optional 'merge' flag to addFFDC() method which certain UserDetail
error log objects will use to cause additional log entries to get
merged together. They will ONLY get merged if they match with the
last section added, to preserve error log order.

In addition, add support for an addData() method on the Attributes
User Detail class. And re-organize code so that constructor methods
are smaller, making final library smaller.

NOTE - the parse() functions are NOT complete, since building and
executing the hb errlparser tool is currently broken. Story 41707
is open to do that work once the tool builds.

Change-Id: I04d85620efe964ac243dd76df78ad4161e5a2f13
RTC: 41534
Reviewed-on: http://gfw160.austin.ibm.com:8080/gerrit/1050
Tested-by: Jenkins Server
Reviewed-by: A. Patrick Williams III <iawillia@us.ibm.com>

1 files changed, 107 insertions, 48 deletions

diff --git a/src/usr/errl/test/errluserdetailtest.H b/src/usr/errl/test/errluserdetailtest.H
index c70119a74..a4a507692 100644
--- a/src/usr/errl/test/errluserdetailtest.H
+++ b/src/usr/errl/test/errluserdetailtest.H
@@ -48,15 +48,15 @@ using   namespace   ERRORLOG;
 class UtilErrlUsrDataTest: public CxxTest::TestSuite
 {
 public:
-    
+
     // Note that errlUserDetailsTarget is tested in the targeting unit test
-    
+
     /**
      * @test testString - Capture a String in an error log
      */
     void testString(void)
     {
-        errlHndl_t l_errl = NULL;
+        errlHndl_t errl = NULL;
 
         TS_TRACE( "testString errorlog user detail data");
         /*@
@@ -68,7 +68,7 @@ public:
         * @userdata2 Test data 2
         * @devdesc  User Details unit test - create string user detail data
         */
-        l_errl = new ErrlEntry(
+        errl = new ErrlEntry(
                 ERRL_SEV_INFORMATIONAL,
                 HBERRL_USERDATA_TEST_MOD_ID,
                 HBERRL_TEST_STRING_UD,
@@ -77,10 +77,16 @@ public:
 
         // Create a test string and add it to the error log as user detail data
         const char * l_pString = "This is a test string";
-        ErrlUserDetailsString(l_pString).addToLog(l_errl);
+        ErrlUserDetailsString(l_pString).addToLog(errl);
+
+        // create more and make sure that they get merged into 1 sub-section
+        ErrlUserDetailsString("String test - string 2").addToLog(errl);
+
+        ErrlUserDetailsString stringUD("String test - string 3");
+        stringUD.addToLog(errl);
 
         // commit the errorlog
-        errlCommit(l_errl, CXXTEST_COMP_ID);
+        errlCommit(errl, CXXTEST_COMP_ID);
     }
 
     /**
@@ -88,9 +94,9 @@ public:
      */
     void testAttribute(void)
     {
-        errlHndl_t l_err = NULL;
+        errlHndl_t errl = NULL;
 
-        TS_TRACE( "testAttribute errorlog user detail data");
+        TS_TRACE( "testAttribute errorlog user detail data and merge");
         /*@
         * @errortype
         * @severity ERRORLOG_SEV_INFORMATIONAL
@@ -100,7 +106,7 @@ public:
         * @userdata2 Test data 2
         * @devdesc  User Details unit test - create string user detail data
         */
-        l_err = new ErrlEntry(
+        errl = new ErrlEntry(
                 ERRL_SEV_INFORMATIONAL,
                 HBERRL_USERDATA_TEST_MOD_ID,
                 HBERRL_TEST_ATTRIBUTE_UD,
@@ -130,48 +136,101 @@ public:
         const Target* c_target;
         c_target = *pProc;
         TS_TRACE( "testAttribute pProc %p", c_target);
-        ErrlUserDetailsString("Attribute test").addToLog(l_err);
-        ErrlUserDetailsTarget(c_target).addToLog(l_err);
-        ErrlUserDetailsBackTrace().addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_CLASS).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_TYPE).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_MODEL).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_PHYS_PATH).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_SCRATCH_UINT8_1).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_HUID).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_DUMMY_WO).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target).addToLog(l_err);
+        ErrlUserDetailsTarget(c_target).addToLog(errl);
+        ErrlUserDetailsTarget(
+            TARGETING::MASTER_PROCESSOR_CHIP_TARGET_SENTINEL).addToLog(errl);
+
+        // all attributes
+        ErrlUserDetailsAttribute(c_target).addToLog(errl);
+
+        // HUID repeated for each addToLog()
+        ErrlUserDetailsAttribute(c_target,ATTR_EC).addToLog(errl);
+        ErrlUserDetailsAttribute(c_target,ATTR_CHIP_ID).addToLog(errl);
+
+        // 1 HUID only
+        ErrlUserDetailsAttribute(c_target,ATTR_HUID).addToLog(errl);
+
+        // HUID only - not there
+        ErrlUserDetailsAttribute(c_target,ATTR_SCRATCH_UINT8_1).addToLog(errl);
+
+        // HUID only - write only
+        ErrlUserDetailsAttribute(c_target,ATTR_DUMMY_WO).addToLog(errl);
+
+        // HUID only - read only
+        ErrlUserDetailsAttribute(c_target,ATTR_CLASS).addToLog(errl);
+
+        //
+        // one HUID then each attribute
+        ErrlUserDetailsAttribute pProcEUDA(c_target,ATTR_CHIP_ID);
+        pProcEUDA.addData(ATTR_EC);
+        pProcEUDA.addData(ATTR_CHIP_ID);
+
+        // skipped - not there
+        pProcEUDA.addData(ATTR_SCRATCH_UINT8_1);
+
+        // skipped - write only
+        pProcEUDA.addData(ATTR_DUMMY_WO);
+
+        // skipped - read only
+        pProcEUDA.addData(ATTR_CLASS);
+
+        // done - write it out
+        pProcEUDA.addToLog(errl);
 
         c_target = *pMembuf;
         TS_TRACE( "testAttribute pMembuf %p", c_target);
-        ErrlUserDetailsString("Attribute test").addToLog(l_err);
-        ErrlUserDetailsTarget(c_target).addToLog(l_err);
-        ErrlUserDetailsBackTrace().addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_CLASS).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_TYPE).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_MODEL).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_PHYS_PATH).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_SCRATCH_UINT8_1).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_HUID).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_DUMMY_WO).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target).addToLog(l_err);
+        ErrlUserDetailsTarget(c_target).addToLog(errl);
+
+        // all attributes
+        ErrlUserDetailsAttribute(c_target).addToLog(errl);
+
+        // one HUID then each attribute
+        ErrlUserDetailsAttribute pMembufEUDA(c_target,ATTR_CHIP_ID);
+        pMembufEUDA.addData(ATTR_EC);
+        pMembufEUDA.addData(ATTR_CHIP_ID);
+        pMembufEUDA.addData(ATTR_MSS_VOLT);
+        pMembufEUDA.addData(ATTR_MSS_FREQ);
+
+        // skipped - not there
+        pMembufEUDA.addData(ATTR_SCRATCH_UINT8_1);
+
+        // skipped - write only
+        pMembufEUDA.addData(ATTR_DUMMY_WO);
+
+        // skipped - read only
+        pMembufEUDA.addData(ATTR_CLASS);
+
+        // done - write it out
+        pMembufEUDA.addToLog(errl);
 
         c_target = *pDimm;
         TS_TRACE( "testAttribute pDimm %p", c_target);
-        ErrlUserDetailsString("Attribute test").addToLog(l_err);
-        ErrlUserDetailsTarget(c_target).addToLog(l_err);
-        ErrlUserDetailsBackTrace().addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_CLASS).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_TYPE).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_MODEL).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_PHYS_PATH).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_SCRATCH_UINT8_1).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_HUID).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target,ATTR_DUMMY_WO).addToLog(l_err);
-        ErrlUserDetailsAttribute(c_target).addToLog(l_err);
-
-#if 0
-        // extended test 
+        ErrlUserDetailsTarget(c_target).addToLog(errl);
+
+        // all attributes
+        ErrlUserDetailsAttribute(c_target).addToLog(errl);
+
+        // one HUID then each attribute
+        ErrlUserDetailsAttribute pDimmEUDA(c_target,ATTR_CHIP_ID);
+        pDimmEUDA.addData(ATTR_EC);
+        pDimmEUDA.addData(ATTR_CHIP_ID);
+        pDimmEUDA.addData(ATTR_MSS_VOLT);
+        pDimmEUDA.addData(ATTR_MSS_FREQ);
+
+        // skipped - not there
+        pDimmEUDA.addData(ATTR_SCRATCH_UINT8_1);
+
+        // skipped - write only
+        pDimmEUDA.addData(ATTR_DUMMY_WO);
+
+        // skipped - read only
+        pDimmEUDA.addData(ATTR_CLASS);
+
+        // done - write it out
+        pDimmEUDA.addToLog(errl);
+
+#if 1
+        // extended test
         uint32_t i = 0;
         for (TargetIterator target = targetService().begin();
             (i < 10) && (target != targetService().end());
@@ -179,13 +238,13 @@ public:
         {
             TS_TRACE( "testAttribute %p", *target);
             const Target* c_target = *target;
-            ErrlUserDetailsTarget(c_target).addToLog(l_err);
-            ErrlUserDetailsAttribute(c_target).addToLog(l_err);
+            ErrlUserDetailsTarget(c_target).addToLog(errl);
+            ErrlUserDetailsAttribute(c_target).addToLog(errl);
         }
 #endif
 
         // commit the errorlog
-        errlCommit(l_err, CXXTEST_COMP_ID);
+        errlCommit(errl, CXXTEST_COMP_ID);
         TS_TRACE( "testAttribute done");
     }