From 26e1beccbeb82ce7a4713ad899eb34b795228891 Mon Sep 17 00:00:00 2001 From: Stephen Warren Date: Wed, 27 Jan 2016 23:57:46 -0700 Subject: test/dm: clear unit test failure count each run The ut command prints a test failure count each time it is executed. This is stored in a global variable which is never reset. Consequently, the printed failure count accumulates across runs. Fix this by clearing the counter each time "ut" is invoked. Signed-off-by: Stephen Warren Acked-by: Simon Glass --- test/dm/test-main.c | 2 ++ 1 file changed, 2 insertions(+) (limited to 'test') diff --git a/test/dm/test-main.c b/test/dm/test-main.c index 91bdda83ab..f2e0048143 100644 --- a/test/dm/test-main.c +++ b/test/dm/test-main.c @@ -81,6 +81,8 @@ static int dm_test_main(const char *test_name) struct unit_test *test; int run_count; + uts->fail_count = 0; + /* * If we have no device tree, or it only has a root node, then these * tests clearly aren't going to work... -- cgit v1.2.1