From 1ca7e2062b4e8c3b211753dcb19c063b5b9b73ca Mon Sep 17 00:00:00 2001 From: Simon Glass Date: Wed, 23 Jul 2014 06:55:18 -0600 Subject: dm: Provide a function to scan child FDT nodes At present only root nodes in the device tree are scanned for devices. But some devices can have children. For example a SPI bus may have several children for each of its chip selects. Add a function which scans subnodes and binds devices for each one. This can be used for the root node scan also, so change it. A device can call this function in its bind() or probe() methods to bind its children. Signed-off-by: Simon Glass --- doc/driver-model/README.txt | 6 +++++- 1 file changed, 5 insertions(+), 1 deletion(-) (limited to 'doc') diff --git a/doc/driver-model/README.txt b/doc/driver-model/README.txt index 672497d482..a2b6122ebc 100644 --- a/doc/driver-model/README.txt +++ b/doc/driver-model/README.txt @@ -95,9 +95,13 @@ are provided in test/dm. To run them, try: You should see something like this: <...U-Boot banner...> - Running 17 driver model tests + Running 18 driver model tests Test: dm_test_autobind Test: dm_test_autoprobe + Test: dm_test_bus_children + Device 'd-test': seq 3 is in use by 'b-test' + Device 'c-test@0': seq 0 is in use by 'a-test' + Device 'c-test@1': seq 1 is in use by 'd-test' Test: dm_test_children Test: dm_test_fdt Device 'd-test': seq 3 is in use by 'b-test' -- cgit v1.2.1