diff options
Diffstat (limited to 'src/usr/i2c/test/eepromddtest.H')
| -rwxr-xr-x | src/usr/i2c/test/eepromddtest.H | 58 |
1 files changed, 31 insertions, 27 deletions
diff --git a/src/usr/i2c/test/eepromddtest.H b/src/usr/i2c/test/eepromddtest.H index 4cd4fad37..fdf55dd8d 100755 --- a/src/usr/i2c/test/eepromddtest.H +++ b/src/usr/i2c/test/eepromddtest.H @@ -5,7 +5,7 @@ /* */ /* IBM CONFIDENTIAL */ /* */ -/* COPYRIGHT International Business Machines Corp. 2011,2013 */ +/* COPYRIGHT International Business Machines Corp. 2011,2014 */ /* */ /* p1 */ /* */ @@ -76,24 +76,28 @@ class EEPROMTest: public CxxTest::TestSuite } testData[] = { - // MVPD of processor - chip 0 - // Write: - { 0x0000, VPD_PRIMARY, 0xfedcba9876543210, 8, false }, - // Read: - { 0x0000, VPD_PRIMARY, 0xfedcba9876543210, 8, true }, + // Read - Only + { 0x0000, VPD_PRIMARY, 0x000f17ba00000000, 4, true }, // SBE Primary of processor - chip 2 - // Write: - { 0x0100, SBE_PRIMARY, 0xaabb000000000000, 2, false }, + // Write: over 128-byte page boundary: + { 0x017F, SBE_PRIMARY, 0xaabb000000000000, 2, false }, + // Read: + { 0x017F, SBE_PRIMARY, 0xaabb000000000000, 2, true }, + + // SBE Backup of processor - chip 3 + // Write: over 256-byte page boundary: + { 0x01FD, SBE_BACKUP, 0x1122334400000000, 4, false }, // Read: - { 0x0100, SBE_PRIMARY, 0xaabb000000000000, 2, true }, + { 0x01FD, SBE_BACKUP, 0x1122334400000000, 4, true }, // SBE Backup of processor - chip 3 - // Write: - { 0x00F0, SBE_BACKUP, 0x1122334400000000, 4, false }, + // Write: inside 128 page boundary: + { 0x005B, SBE_BACKUP, 0xbad5adcabf0b7000, 7, false }, // Read: - { 0x00F0, SBE_BACKUP, 0x1122334400000000, 4, true }, + { 0x005B, SBE_BACKUP, 0xbad5adcabf0b7000, 7, true }, + }; const uint32_t NUM_CMDS = sizeof(testData)/sizeof(testData[0]); @@ -157,7 +161,7 @@ class EEPROMTest: public CxxTest::TestSuite { uint64_t data; - // if a read, initialize data, else, set data to write + // if a read, clear data; else, set data to write if( testData[i].rnw ) { data = 0x0ull; @@ -214,12 +218,12 @@ class EEPROMTest: public CxxTest::TestSuite /** * @brief EEPROM Read/Write Large Test - * This test will read and write 1KB of data to SBE Backup + * This test will read and write 603 bytes of data to SBE Backup * VPD. It will attempt to restore the original data at * the end of the test. * - * Note: 1st 1K of SBE EEPROM data is currently blank, so this - * test will read and write to that address space + * Note: 1st 768 bytes of SBE EEPROM data is currently blank, so + * this test will read and write below that address space */ void testEEPROMReadWriteLarge ( void ) { @@ -228,12 +232,15 @@ class EEPROMTest: public CxxTest::TestSuite int num_ops = 0; int cmds = 0; - // Create 1KB buffers - size_t testBufLen = 1024; + // Create 603-byte buffers + size_t testBufLen = 603; uint8_t testBuffer[testBufLen]; uint8_t new_data[testBufLen]; uint8_t original_data[testBufLen]; + // Use small offset to force more complicated page-boundary testing + uint8_t offset = 0x11; + TRACFCOMP( g_trac_eeprom, "testEEPROMReadWriteLarge - Start" ); @@ -255,7 +262,7 @@ class EEPROMTest: public CxxTest::TestSuite TargetHandleList fullList; fullList.push_back( testTarget ); - // 5 operations of 1K data per target (details below) + // 5 operations per target (details below) const uint32_t NUM_CMDS = 5; // Number of total operations @@ -297,10 +304,9 @@ class EEPROMTest: public CxxTest::TestSuite } - // Valid Buffer, so memcpy the first 1KB + // Valid Buffer, so memcpy the first 603 bytes memcpy( new_data, tmp_ptr, testBufLen ); - /************************************************************/ /* Loop through targets and perform operations */ /************************************************************/ @@ -318,11 +324,9 @@ class EEPROMTest: public CxxTest::TestSuite // Before starting, clear original data buffer memset(original_data, 0x0, testBufLen); - for (uint8_t j = 1; j <= NUM_CMDS; j++) { - - // Details: 5 operations of 1K data per target + // Details: 5 operations per target // 1) Read Original Data and Save It // 2) Write New Data // 3) Read New Data and Compare @@ -356,7 +360,8 @@ class EEPROMTest: public CxxTest::TestSuite fullList[0], testBuffer, testBufLen, - DEVICE_EEPROM_ADDRESS(SBE_BACKUP,0x0)); + DEVICE_EEPROM_ADDRESS(SBE_BACKUP, + offset)); if( err ) { @@ -550,7 +555,6 @@ class EEPROMTest: public CxxTest::TestSuite // Set max length and offset dataSize = 0xFFFFFFFFFFFFFFFF; offset = 0xFFFFFFFFFFFFFFFF; - num_ops++; err = deviceOp( DeviceFW::WRITE, testTarget, @@ -578,7 +582,7 @@ class EEPROMTest: public CxxTest::TestSuite } while( 0 ); TRACFCOMP( g_trac_eeprom, - "testEEPROMInvalidChip - End: %d/%d fails", + "testEEPROMOverflow - End: %d/%d fails", fails, num_ops ); } |
