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* mtd: nand: introduce NAND_CREATE_EMPTY_BBTSebastian Andrzej Siewior2010-10-251-1/+1
| | | | | | | | | | it will create an empty BBT table without considering vendor's BBT information. Vendor's information may be unavailable if the NAND controller has a different DATA & OOB layout or this information may be allready purged. Signed-off-by: Sebastian Andrzej Siewior <bigeasy@linutronix.de> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
* mtd: nand: add support for BBT without OOBSebastian Andrzej Siewior2010-10-251-0/+2
| | | | | | | | | | | | | | | | | | The first (sixt) byte in the OOB area contains vendor's bad block information. During identification of the NAND chip this information is collected by scanning the complete chip. The option NAND_USE_FLASH_BBT is used to store this information in a sector so we don't have to scan the complete flash. Unfortunately the code stores a marker in order to recognize the BBT in the OOB area. This will fail if the OOB area is completely used for ECC. This patch introduces the option NAND_USE_FLASH_BBT_NO_OOB which has to be used with NAND_USE_FLASH_BBT. It will then store BBT on flash without touching the OOB area. The BBT format on flash remains same except the first page starts with the recognition pattern followed by the version byte. This change was tested in nandsim and it looks good so far :) Signed-off-by: Sebastian Andrzej Siewior <bigeasy@linutronix.de> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
* mtd: Update copyright noticesDavid Woodhouse2010-08-081-2/+16
| | | | Signed-off-by: David Woodhouse <dwmw2@infradead.org>
* mtd: nand: more BB Detection refactoring and dynamic scan optionsBrian Norris2010-08-021-0/+4
| | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | This is a revision to PATCH 2/2 that I sent. Link: http://lists.infradead.org/pipermail/linux-mtd/2010-July/030911.html Added new flag for scanning of both bytes 1 and 6 of the OOB for a BB marker (instead of simply one or the other). The "check_pattern" and "check_short_pattern" functions were updated to include support for scanning the two different locations in the OOB. In order to handle increases in variety of necessary scanning patterns, I implemented dynamic memory allocation of nand_bbt_descr structs in new function 'nand_create_default_bbt_descr()'. This replaces some increasingly-unwieldy, statically-declared descriptors. It can replace several more (e.g. "flashbased" structs). However, I do not test the flashbased options personally. How this was tested: I referenced 30+ data sheets (covering 100+ parts), and I tested a selection of 10 different chips to varying degrees. Particularly, I tested the creation of bad-block descriptors and basic BB scanning on three parts: ST NAND04GW3B2D, 2K page ST NAND128W3A, 512B page Samsung K9F1G08U0A, 2K page To test these, I wrote some fake bad block markers to the flash (in OOB bytes 1, 6, and elsewhere) to see if the scanning routine would detect them properly. However, this method was somewhat limited because the driver I am using has some bugs in its OOB write functionality. Signed-off-by: Brian Norris <norris@broadcom.com> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
* mtd: nand: edit macro flag for BBT scan of last page in blockBrian Norris2010-08-021-0/+2
| | | | | | | | | | | | NAND_BB_LAST_PAGE used to be in nand.h, but it pertained to bad block management and so belongs next to NAND_BBT_SCAN2NDPAGE in bbm.h. Also, its previous flag value (0x00000400) conflicted with NAND_BBT_SCANALLPAGES so I changed its value to 0x00008000. All uses of the name were modified to provide consistency with other "NAND_BBT_*" flags. Signed-off-by: Brian Norris <norris@broadcom.com> Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
* mtd: use bbm.h in nand.hAlessandro Rubini2009-09-241-17/+18
| | | | | | | | | | This consolidates common code in nand.h and bbm.h. The comments and data structures were the same, this keeps the comment from nand.h as it fits 80 columns, while the one in bbm.h did not. Signed-off-by: Alessandro Rubini <rubini@unipv.it> Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
* [MTD] OneNAND: Error message printing and bad block scan errosKyungmin Park2007-02-071-0/+7
| | | | | | | | Provide the bad block scan with its own read function so that important error messages that are not from the the bad block scan, can always be printed. Signed-off-by: Adrian Hunter <ext-adrian.hunter@nokia.com> Signed-off-by: Kyungmin Park <kyungmin.park@samsung.com>
* MTD: kernel-doc fixes + additionsRandy Dunlap2006-06-291-16/+19
| | | | | | | | | Fix some kernel-doc typos/spellos. Use kernel-doc syntax in places where it was almost used. Correct/add struct, struct field, and function param names where needed. Signed-off-by: Randy Dunlap <rdunlap@xenotime.net> Signed-off-by: David Woodhouse <dwmw2@infradead.org>
* [MTD] includes: Clean up trailing white spacesThomas Gleixner2005-11-071-1/+1
| | | | Signed-off-by: Thomas Gleixner <tglx@linutronix.de>
* [MTD] OneNAND: Add missing filesKyungmin Park2005-11-061-0/+122
Simple bad block table source and header files Signed-off-by: Kyungmin Park <kyungmin.park@samsung.com> Signed-off-by: Thomas Gleixner <tglx@linutronix.de>
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