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Diffstat (limited to 'include/asm-sparc64/estate.h')
| -rw-r--r-- | include/asm-sparc64/estate.h | 50 |
1 files changed, 50 insertions, 0 deletions
diff --git a/include/asm-sparc64/estate.h b/include/asm-sparc64/estate.h new file mode 100644 index 000000000000..a719c3d2f6b1 --- /dev/null +++ b/include/asm-sparc64/estate.h @@ -0,0 +1,50 @@ +/* $Id: estate.h,v 1.1 2001/03/28 10:56:34 davem Exp $ */ +#ifndef _SPARC64_ESTATE_H +#define _SPARC64_ESTATE_H + +/* UltraSPARC-III E-cache Error Enable */ +#define ESTATE_ERROR_FMT 0x0000000000040000 /* Force MTAG ECC */ +#define ESTATE_ERROR_FMESS 0x000000000003c000 /* Forced MTAG ECC val */ +#define ESTATE_ERROR_FMD 0x0000000000002000 /* Force DATA ECC */ +#define ESTATE_ERROR_FDECC 0x0000000000001ff0 /* Forced DATA ECC val */ +#define ESTATE_ERROR_UCEEN 0x0000000000000008 /* See below */ +#define ESTATE_ERROR_NCEEN 0x0000000000000002 /* See below */ +#define ESTATE_ERROR_CEEN 0x0000000000000001 /* See below */ + +/* UCEEN enables the fast_ECC_error trap for: 1) software correctable E-cache + * errors 2) uncorrectable E-cache errors. Such events only occur on reads + * of the E-cache by the local processor for: 1) data loads 2) instruction + * fetches 3) atomic operations. Such events _cannot_ occur for: 1) merge + * 2) writeback 2) copyout. The AFSR bits associated with these traps are + * UCC and UCU. + */ + +/* NCEEN enables instruction_access_error, data_access_error, and ECC_error traps + * for uncorrectable ECC errors and system errors. + * + * Uncorrectable system bus data error or MTAG ECC error, system bus TimeOUT, + * or system bus BusERR: + * 1) As the result of an instruction fetch, will generate instruction_access_error + * 2) As the result of a load etc. will generate data_access_error. + * 3) As the result of store merge completion, writeback, or copyout will + * generate a disrupting ECC_error trap. + * 4) As the result of such errors on instruction vector fetch can generate any + * of the 3 trap types. + * + * The AFSR bits associated with these traps are EMU, EDU, WDU, CPU, IVU, UE, + * BERR, and TO. + */ + +/* CEEN enables the ECC_error trap for hardware corrected ECC errors. System bus + * reads resulting in a hardware corrected data or MTAG ECC error will generate an + * ECC_error disrupting trap with this bit enabled. + * + * This same trap will also be generated when a hardware corrected ECC error results + * during store merge, writeback, and copyout operations. + */ + +/* In general, if the trap enable bits above are disabled the AFSR bits will still + * log the events even though the trap will not be generated by the processor. + */ + +#endif /* _SPARC64_ESTATE_H */ |
