diff options
Diffstat (limited to 'include/asm-sparc64/estate.h')
| -rw-r--r-- | include/asm-sparc64/estate.h | 50 |
1 files changed, 1 insertions, 49 deletions
diff --git a/include/asm-sparc64/estate.h b/include/asm-sparc64/estate.h index 520c08560d1b..bedd0ef5f19c 100644 --- a/include/asm-sparc64/estate.h +++ b/include/asm-sparc64/estate.h @@ -1,49 +1 @@ -#ifndef _SPARC64_ESTATE_H -#define _SPARC64_ESTATE_H - -/* UltraSPARC-III E-cache Error Enable */ -#define ESTATE_ERROR_FMT 0x0000000000040000 /* Force MTAG ECC */ -#define ESTATE_ERROR_FMESS 0x000000000003c000 /* Forced MTAG ECC val */ -#define ESTATE_ERROR_FMD 0x0000000000002000 /* Force DATA ECC */ -#define ESTATE_ERROR_FDECC 0x0000000000001ff0 /* Forced DATA ECC val */ -#define ESTATE_ERROR_UCEEN 0x0000000000000008 /* See below */ -#define ESTATE_ERROR_NCEEN 0x0000000000000002 /* See below */ -#define ESTATE_ERROR_CEEN 0x0000000000000001 /* See below */ - -/* UCEEN enables the fast_ECC_error trap for: 1) software correctable E-cache - * errors 2) uncorrectable E-cache errors. Such events only occur on reads - * of the E-cache by the local processor for: 1) data loads 2) instruction - * fetches 3) atomic operations. Such events _cannot_ occur for: 1) merge - * 2) writeback 2) copyout. The AFSR bits associated with these traps are - * UCC and UCU. - */ - -/* NCEEN enables instruction_access_error, data_access_error, and ECC_error traps - * for uncorrectable ECC errors and system errors. - * - * Uncorrectable system bus data error or MTAG ECC error, system bus TimeOUT, - * or system bus BusERR: - * 1) As the result of an instruction fetch, will generate instruction_access_error - * 2) As the result of a load etc. will generate data_access_error. - * 3) As the result of store merge completion, writeback, or copyout will - * generate a disrupting ECC_error trap. - * 4) As the result of such errors on instruction vector fetch can generate any - * of the 3 trap types. - * - * The AFSR bits associated with these traps are EMU, EDU, WDU, CPU, IVU, UE, - * BERR, and TO. - */ - -/* CEEN enables the ECC_error trap for hardware corrected ECC errors. System bus - * reads resulting in a hardware corrected data or MTAG ECC error will generate an - * ECC_error disrupting trap with this bit enabled. - * - * This same trap will also be generated when a hardware corrected ECC error results - * during store merge, writeback, and copyout operations. - */ - -/* In general, if the trap enable bits above are disabled the AFSR bits will still - * log the events even though the trap will not be generated by the processor. - */ - -#endif /* _SPARC64_ESTATE_H */ +#include <asm-sparc/estate.h> |
