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authorSimon Glass <sjg@chromium.org>2014-10-13 23:42:11 -0600
committerSimon Glass <sjg@chromium.org>2014-10-22 10:36:52 -0600
commit0ae0cb7b50ab7836fb2a625a389d7a83698c2150 (patch)
tree59a26153bfd003ecc93c53883fcf5627e29c84d7 /test
parentebcab48a031fc96d5d6292564a35cf772d4e539c (diff)
downloadblackbird-obmc-uboot-0ae0cb7b50ab7836fb2a625a389d7a83698c2150.tar.gz
blackbird-obmc-uboot-0ae0cb7b50ab7836fb2a625a389d7a83698c2150.zip
dm: sf: Add tests for SPI flash
Add a simple test for SPI that uses SPI flash. It operates by creating a SPI flash file and using the 'sf test' command to test that all operations work correctly. Signed-off-by: Simon Glass <sjg@chromium.org> Acked-by: Jagannadha Sutradharudu Teki <jagannadh.teki@gmail.com>
Diffstat (limited to 'test')
-rw-r--r--test/dm/Makefile1
-rw-r--r--test/dm/sf.c43
-rw-r--r--test/dm/test.dts17
3 files changed, 60 insertions, 1 deletions
diff --git a/test/dm/Makefile b/test/dm/Makefile
index d1b9c9a48b..75d3d41536 100644
--- a/test/dm/Makefile
+++ b/test/dm/Makefile
@@ -19,4 +19,5 @@ obj-$(CONFIG_DM_TEST) += ut.o
ifneq ($(CONFIG_SANDBOX),)
obj-$(CONFIG_DM_GPIO) += gpio.o
obj-$(CONFIG_DM_SPI) += spi.o
+obj-$(CONFIG_DM_SPI_FLASH) += sf.o
endif
diff --git a/test/dm/sf.c b/test/dm/sf.c
new file mode 100644
index 0000000000..57dd1345c4
--- /dev/null
+++ b/test/dm/sf.c
@@ -0,0 +1,43 @@
+/*
+ * Copyright (C) 2013 Google, Inc
+ *
+ * SPDX-License-Identifier: GPL-2.0+
+ */
+
+#include <common.h>
+#include <dm.h>
+#include <fdtdec.h>
+#include <spi.h>
+#include <spi_flash.h>
+#include <asm/state.h>
+#include <dm/ut.h>
+#include <dm/test.h>
+#include <dm/util.h>
+
+/* Test that sandbox SPI flash works correctly */
+static int dm_test_spi_flash(struct dm_test_state *dms)
+{
+ /*
+ * Create an empty test file and run the SPI flash tests. This is a
+ * long way from being a unit test, but it does test SPI device and
+ * emulator binding, probing, the SPI flash emulator including
+ * device tree decoding, plus the file-based backing store of SPI.
+ *
+ * More targeted tests could be created to perform the above steps
+ * one at a time. This might not increase test coverage much, but
+ * it would make bugs easier to find. It's not clear whether the
+ * benefit is worth the extra complexity.
+ */
+ ut_asserteq(0, run_command_list(
+ "sb save hostfs - spi.bin 0 200000;"
+ "sf probe;"
+ "sf test 0 10000", -1, 0));
+ /*
+ * Since we are about to destroy all devices, we must tell sandbox
+ * to forget the emulation device
+ */
+ sandbox_sf_unbind_emul(state_get_current(), 0, 0);
+
+ return 0;
+}
+DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
diff --git a/test/dm/test.dts b/test/dm/test.dts
index 8489595155..1fba792564 100644
--- a/test/dm/test.dts
+++ b/test/dm/test.dts
@@ -81,7 +81,7 @@
compatible = "google,another-fdt-test";
};
- base-gpios {
+ gpio_a: base-gpios {
compatible = "sandbox,gpio";
gpio-bank-name = "a";
num-gpios = <20>;
@@ -92,4 +92,19 @@
gpio-bank-name = "b";
num-gpios = <10>;
};
+
+ spi@0 {
+ #address-cells = <1>;
+ #size-cells = <0>;
+ reg = <0>;
+ compatible = "sandbox,spi";
+ cs-gpios = <0>, <&gpio_a 0>;
+ spi.bin@0 {
+ reg = <0>;
+ compatible = "spansion,m25p16", "spi-flash";
+ spi-max-frequency = <40000000>;
+ sandbox,filename = "spi.bin";
+ };
+ };
+
};
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