From 2283a24d0273ae66ec0b826a7b9ed567bba1f0ef Mon Sep 17 00:00:00 2001 From: Patrick Williams Date: Wed, 28 Aug 2013 15:16:54 -0500 Subject: Resolve testcase race conditions with SCAN. A number of test cases were writing to the SCAN select register and if the SCAN device driver unit tests were running at the same time they would clobber each other. Moved the other test cases to utilize a core scratch register instead. Change-Id: I243500ce40cdb75e1052541056f9460e50e0bbcd Reviewed-on: http://gfw160.austin.ibm.com:8080/gerrit/5977 Tested-by: Jenkins Server Reviewed-by: MIKE J. JONES Reviewed-by: Daniel M. Crowell Reviewed-by: A. Patrick Williams III --- src/include/sys/mmio.h | 4 ++-- 1 file changed, 2 insertions(+), 2 deletions(-) (limited to 'src/include/sys') diff --git a/src/include/sys/mmio.h b/src/include/sys/mmio.h index 9fd609cf9..d536b281b 100644 --- a/src/include/sys/mmio.h +++ b/src/include/sys/mmio.h @@ -90,8 +90,8 @@ enum MMIO_Scratch_Register MMIO_SCRATCH_RSVD_T3 = 0x18, /** Thread4 Scratch Register - Unused */ MMIO_SCRATCH_RSVD_T4 = 0x20, - /** Thread5 Scratch Register - Unused */ - MMIO_SCRATCH_RSVD_T5 = 0x28, + /** Thread5 Scratch Register - Unused (unit tests may modify) */ + MMIO_SCRATCH_RSVD_T5_TESTCASES = 0x28, /** Thread6 Scratch Register - Identifies where hostboot currently resides and how large the space is */ MMIO_SCRATCH_MEMORY_STATE = 0x30, -- cgit v1.2.3